IECQ Website > IECQ Online Training Certificate System > View by 1. Trainings by TBs ( Lead Assessor )
IECQ Guest User | Login
IEC Quality Assessment System for Electronic Components (IECQ System)
leftca_pagelinks
[ Year selection: All | Lead Assessor | Internal Assessor | Implementation | External Assessor | Coordinator ]

TBIECQ Certificate no.Attendee NameClass dates
34Show details for Business & Quality Process Management, LLC (BQPM)Business & Quality Process Management, LLC (BQPM)
72Hide details for CED (Taiwan)CED (Taiwan)
15Show details for 20112011
2Show details for 20102010
25Show details for 20092009
30Hide details for 20082008
IECQ-T CEDTW 08.0001 Issue 1Zhang, Xin HuiApril 28~30, 2008
IECQ-T CEDTW 08.0002 Issue 1Li, GangApril 28~30, 2008
IECQ-T CEDTW 08.0003 Issue 1Li, ZhengApril 28~30, 2008
IECQ-T CEDTW 08.0004 Issue 1Man, Yan BoApril 28~30, 2008
IECQ-T CEDTW 08.0005 Issue 1Lin, Yen HuangApril 28~30, 2008
IECQ-T CEDTW 08.0006 Issue 1Xiao, Huei April 28~30, 2008
IECQ-T CEDTW 08.0007 Issue 1Wang, Chia Lin April 28~30, 2008
IECQ-T CEDTW 08.0008 Issue 1Rui, Lian You April 28~30, 2008
IECQ-T CEDTW 08.0009 Issue 1Su, HeApril 28~30, 2008
IECQ-T CEDTW 08.0010 Issue 1Li, Yan Yan April 28~30, 2008
IECQ-T CEDTW 08.0011 Issue 1Chang, Tien-HuiMay 7~9, 2008
IECQ-T CEDTW 08.0012 Issue 1Chi, Tsung-HungMay 7~9, 2008
IECQ-T CEDTW 08.0013 Issue 1Shih, Yi-TeJune 16~18, 2008
IECQ-T CEDTW 08.0014 Issue 1Chen, Ming ChienJune 25~27, 2008
IECQ-T CEDTW 08.0015 Issue 1Ying, Ray Kuo FuJune 25~27, 2008
IECQ-T CEDTW 08.0016 Issue 1Liao, Wen-ChiJune 25~27, 2008
IECQ-T CEDTW 08.0017 Issue 1Mark Chih-ming ChenJune 25~27, 2008
IECQ-T CEDTW 08.0018 Issue 1Chien-Yi HuangJune 25~27, 2008
IECQ-T CEDTW 08.0019 Issue 1Ying-Hsien, Michael, ChenJune 25~27, 2008
IECQ-T CEDTW 08.0020 Issue 1Spock YuanJune 25~27, 2008
IECQ-T CEDTW 08.0021 Issue 1Teng, Mao-YingJune 25~27, 2008
IECQ-T CEDTW 08.0022 Issue 1Hung, Che-Chih July 16~18, 2008
IECQ-T CEDTW 08.0023 Issue 1Peng, Hsiao-LiJuly 16~18, 2008
IECQ-T CEDTW 08.0024 Issue 1Chih-Kang, ChenJuly 16~18, 2008

© Copyright 2024 IEC, Geneva Switzerland. All rights reserved.