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IEC Quality Assessment System for Electronic Components (IECQ System)
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TBIECQ Certificate no.Attendee NameClass dates
34Show details for Business & Quality Process Management, LLC (BQPM)Business & Quality Process Management, LLC (BQPM)
72Show details for CED (Taiwan)CED (Taiwan)
22Show details for Det Norske Veritas - DNV (Taiwan)Det Norske Veritas - DNV (Taiwan)
4Show details for Hong Kong Productivity CouncilHong Kong Productivity Council
833Show details for IECQ SystemIECQ System
19Show details for Intertek Testing Service Shenzhen, Ltd.Intertek Testing Service Shenzhen, Ltd.
1Show details for Issuer_1 Name not foundIssuer_1 Name not found
27Show details for Korea Testing Laboratory (KTL)Korea Testing Laboratory (KTL)
7Show details for LCIE-SNQLCIE-SNQ
61Show details for SAI Global Co., Ltd., (Korea)SAI Global Co., Ltd., (Korea)
6Show details for SGS-CSTC Standards Technical Services Co., LtdSGS-CSTC Standards Technical Services Co., Ltd
75Show details for SGS AcademySGS Academy
15Show details for SGS Central/North ChinaSGS Central/North China
1Show details for SGS Hong Kong LimitedSGS Hong Kong Limited
2Show details for SGS Korea Co., Ltd.SGS Korea Co., Ltd.
23Hide details for SGS South ChinaSGS South China
23Hide details for 20102010
IECQ-T SGSCN4 10.0001 Issue 1Canxiong GUOApril 12~14, 2010
IECQ-T SGSCN4 10.0002 Issue 1Roger Han HEApril 12~14, 2010
IECQ-T SGSCN4 10.0003 Issue 1Minyan WANGApril 12~14, 2010
IECQ-T SGSCN4 10.0004 Issue 1Joseph Xihua JIAOApril 12~14, 2010
IECQ-T SGSCN4 10.0005 Issue 1Kevin Jiaxing BAOApril 12~14, 2010
IECQ-T SGSCN4 10.0006 Issue 1Felix Haibo YUApril 12~14, 2010
IECQ-T SGSCN4 10.0007 Issue 1Hammer Hanwen ZHANGApril 12~14, 2010
IECQ-T SGSCN4 10.0008 Issue 1Nick Ning KANGApril 12~14, 2010
IECQ-T SGSCN4 10.0009 Issue 1Bob Pengcong HUANGApril 12~14, 2010
IECQ-T SGSCN4 10.0010 Issue 1Neil Yanbin HUANGApril 12~14, 2010
IECQ-T SGSCN4 10.0011 Issue 1James Jiamin FANApril 12~14, 2010
IECQ-T SGSCN4 10.0012 Issue 1Janus Liu LIUApril 12~14, 2010
IECQ-T SGSCN4 10.0013 Issue 1Alva Lifang WUSeptember 28~30, 2010

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